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Beyond Silicon MOS : An Electrical Study on Interface and Gate Dielectrics with ac Admittance Techniques
Beyond Silicon MOS : An Electrical Study on Interface and Gate Dielectrics with ac Admittance Techniques
2019
Dennis Lin
Abhitosh Vais
Abhinav Gaur
Guy Brammertz
Alireza Alian
Laura Nyns
Sonja Sioncke
Annelies Delabie
Inge Asselberghs
Iuliana Radu
Nadine Collaert
Kristin De Meyer
Marc Heyns
Keywords:
Materials science
Composite material
Optoelectronics
Admittance
AND gate
Dielectric
Silicon
Engineering physics
Correction
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