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Dependence of Tetrahedral Bond Lengths on the Surface Passivation and Stacking-Fault Density of CdSe Nanocrystals
Dependence of Tetrahedral Bond Lengths on the Surface Passivation and Stacking-Fault Density of CdSe Nanocrystals
2019
Pin Jiun Wu
Yuri P. Stetsko
Meng Ting Hsieh
Keywords:
Nanocrystal
Materials science
Chemical physics
Stacking fault
Composite material
Passivation
Bond length
Tetrahedron
Extended X-ray absorption fine structure
Analytical chemistry
cdse nanocrystals
Crystallography
Synchrotron radiation
X-ray crystallography
Correction
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