Single-shot dynamic transmission electron microscopy
2006
A dynamic transmission electron microscope (DTEM) has been designed and implemented to study structural dynamics in condensed matter systems. The DTEM is a conventional in situ transmission electron microscope (TEM) modified to drive material processes with a nanosecond laser, “pump” pulse and measure it shortly afterward with a 30-ns-long probe pulse of ∼107 electrons. An image with a resolution of <20nm may be obtained with a single pulse, largely eliminating the need to average multiple measurements and enabling the study of unique, irreversible events with nanosecond- and nanometer-scale resolution. Space charge effects, while unavoidable at such a high current, may be kept to reasonable levels by appropriate choices of operating parameters. Applications include the study of phase transformations and defect dynamics at length and time scales difficult to access with any other technique. This single-shot approach is complementary to stroboscopic TEM, which is capable of much higher temporal resolution ...
Keywords:
- Temporal resolution
- Nanosecond
- Energy filtered transmission electron microscopy
- Optics
- High-resolution transmission electron microscopy
- Scanning transmission electron microscopy
- Conventional transmission electron microscope
- Transmission electron microscopy
- Electron tomography
- Analytical chemistry
- Physics
- Space charge
- Correction
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