A New Eddy Current Surface Probe for Short Flaws with Minimal Lift‐Off Noise

The authors have devised a new eddy current surface probe that generates minimal lift‐off noise and provides phase information on depth of flaws. The probe comprises a tangential exciting coil and two tangential detecting coils. The authors expect that the new probe will make eddy current testing more reliable in detecting flaws and more quantitative in evaluating depth of flaws than the conventional probes.