A concurrent testing method for NoC switches

This paper proposes reuse of on-chip networks for testing switches in network on chips (NoCs). The proposed algorithm broadcasts test vectors of switches through the on-chip networks and detects faults by comparing output responses of switches with each other. This algorithm alleviates the need for: (1) external comparison of the output response of the circuit-under-test with the response of a fault free circuit stored on a tester (2) on-chip signature analysis (3) a dedicated test-bus to reach test vectors and collect their responses. Experimental results on a few test benches compare the proposed algorithm with traditional system on chip (SoC) test methods.