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Reconstructing field ion microscopy and atom probe data
Reconstructing field ion microscopy and atom probe data
2017
Baptiste Gault
Frédéric De Geuser
Shyam Katnagallu
Gholamali Ali Nematollahi
Michal Dagan
Stefan Parviainen
Ann Kathrin Rusitzka
Errin Johnson
Gustav Sundell
Martin Andersson
Leigh Stephenson
Jörg Neugebauer
Michael P. Moody
François Vurpillot
Dierk Raabe
Keywords:
Atom probe
Field ion microscope
Analytical chemistry
Scanning capacitance microscopy
Chemistry
Materials science
Atomic physics
Correction
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