Characterization of the Reflectivity of Various Black Materials
2018
We present total and specular reflectance measurements of various materials that are commonly (and uncommonly) used
to provide baffling and/or to minimize the effect of stray light in optical systems. More specifically, we investigate the
advantage of using certain black surfaces and their role in suppressing stray light on detectors in optical systems. We
measure the total reflectance of the samples over a broad wavelength range (250 < λ < 2500 nm) that is of interest to
astronomical instruments in the ultraviolet, visible, and near-infrared regimes. Additionally, we use a helium-neon laser
to measure the specular reflectance of the samples at various angles. Finally, we compare these two measurements and
derive the specular fraction for each sample.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
0
References
15
Citations
NaN
KQI