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Elings V: Short cantilevers for atomic force microscopy
Elings V: Short cantilevers for atomic force microscopy
1996
Deron A. Walters
Jason Cleveland
Neil H. Thomson
Paul K. Hansma
Mark A. Wendman
Gus Gurley
Keywords:
Atomic force acoustic microscopy
Conductive atomic force microscopy
Analytical chemistry
Scanning capacitance microscopy
Atomic force microscopy
Cantilever
Kelvin probe force microscope
Materials science
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