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Ta/Cu1−x Ndx/NiFe/Ta Layers Characterized Using TEM/Microanalysis Techniques
Ta/Cu1−x Ndx/NiFe/Ta Layers Characterized Using TEM/Microanalysis Techniques
2019
Jian-Guo Zheng
Qian Chen
Ya Zhai
Keywords:
Metallurgy
Analytical chemistry
Microanalysis
Materials science
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