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Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS | NIST
Environmental SEM Electron Damage Imaging of Self Assembled Monolayers with SIMS | NIST
1997
Scott A. Wight
Greg Gillen
T M. Herne
Keywords:
NIST
Environmental scanning electron microscope
Analytical chemistry
Self-assembled monolayer
Materials science
Electron
Nanotechnology
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