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Influence of secondary tip shape on illumination-mode near-field scanning optical microscopy images
Influence of secondary tip shape on illumination-mode near-field scanning optical microscopy images
1999
Lee J. Richter
Claire E. Jordan
Richard R. Cavanagh
Garnett W. Bryant
Ansheng Liu
Stephan J. Stranick
Christine D. Keating
Michael J. Natan
Keywords:
Physics
Optics
Atomic force acoustic microscopy
Scanning confocal electron microscopy
Scanning probe microscopy
Dark field microscopy
Scanning ion-conductance microscopy
Microscopy
Vibrational analysis with scanning probe microscopy
Near-field scanning optical microscope
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