Noise Characterization of an Event-Based Imager

This work presents a characterization of an event-based CMOS imager using the Photon Transfer Curve methodology, which allows to estimate performance parameters like Fixed Pattern Noise, Conversion Gain, Read Noise and Quantum Efficiency. The imager is a 127 × 127 pixel array, with 40μm pitch and processing in the pixel, fabricated in a 90nm CMOS technology.