Novel low cost and DNU online self-recoverable RHBD latch design for nanoscale CMOS

This paper presents a novel low cost and double node upset (DNU) online self-recoverable latch design using radiation hardening by design (RHBD) technology. The latch mainly consists of 8 interlocked input-split inverters. Since all internal nodes are interlocked, if any of the possible node pairs occurs a DNU, the latch can restore back. Simulation results have demonstrated the DNU online self-recoverability and also demonstrated that the proposed latch design saves 71.68% transmission delay, 72.92% power dissipation and 93.69% comprehensive delay-power-area product (DPAP) on average, compared with the up-to-date DNU online self-recoverable latch designs.