Measurement system for test memory cells based on keysight B1500A semiconductor device analyzer running LabVIEW software

The Keysight B1500A semiconductor device analyzer based measurement system for test memory cells research is introduced. The connection of a device under test is described as well as the full list of the utilized equipment. The features of the Keysight equipment remote control by means of Keysight VISA are demonstrated; code examples in LabVIEW environment are also presented.