Thickness dependence of the Maxwell-Wagner-Sillars dielectric relaxation dynamics in semicrystalline fluorinated parylene

In summary, the effect of film thicknesses between 1.4 and 49.4 µm on the MWS relaxation in PA-F polymer films have been studied by broadband dielectric spectroscopy in wide temperature (20 °C to 400 °C) and frequency (100 mHz to 1 MHz) ranges. At the lowest frequencies, the variation of έ and tanδ with temperature shows the presence of the MWS relaxation. The results show a good correlation between the PA-F crystallinity increase (crystallite size growth as revealed by XRD results.) with increasing film thickness and the. shift of the MWS relaxation towards higher temperature and lower frequency.