A Novel Mechanism for Relaxor–Ferroelectric Transition in PLZT(8/65/35)

We report a novel mechanism for the spontaneous transition to the ferroelectric (FE) phase in a typical relaxor, PLZT(8/65/35). Dielectric, FE, induced strain, and structural studies reveal the influence of acceptor dopant Cu2+ on this transition. That this transition occurs under zero-field conditions reveals yet another challenge in the use of copper metal electrodes for PLZT-based thin-film devices.