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次32奈米CMOS元件可靠性分析、量子結構效應、與蒙地卡羅電荷傳輸模擬
次32奈米CMOS元件可靠性分析、量子結構效應、與蒙地卡羅電荷傳輸模擬
2009
Dahui Wang
Wang Tahui
Keywords:
Electronic band structure
Quantum Hall effect
Statistical physics
Monte Carlo method
Physics
Correction
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