Low ON-Resistance GaN Schottky Barrier Diode With High V-ON Uniformity Using LPCVD Si3N4 Compatible Self-Terminated, Low Damage Anode Recess Technology
2018
National Key Research and Development Program of China [2017YFB0403000, 2016YFB0400200]; National Natural Science Foundation of China [11634002, 61774002]
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