XPS characterization of single crystalline SrLaGa3O7:Nd

Abstract Core-level XPS studies of single crystalline SrLaGa 3 O 7 (SLGO) doped with Nd have been performed for the first time. The detailed analysis of the main XPS core lines of SLGO:Nd included the comparative literature data for the selected oxide compounds containing La and/or Sr, Nd or Ga cations. In particular, the binding energies (BEs) of the Ln 3d 5/2 core levels (Ln = La, Nd) in SLGO:Nd were found consistent with the relevant ones for the La- and Nd-based oxides considered, thus indicating that they represent the ground final states of La 3+ and Nd 3+ ions (respectively) in the crystal lattice after photoexcitation. Analogous consistency has been found for the XPS-derived BEs of the Sr 3d 5/2 and Ga 2p 3/2 core levels related to the Sr 2+ and Ga 3+ cationic states in SLGO and the corresponding oxide compounds. Generally, the binding energies of the deep core levels of cations in SLGO:Nd and the other oxides considered are mainly determined by their common oxygen ligand, irrespectively of the crystalline structure.