A method of chromatic dispersion retrieval from a zero-mean spectral interferogram

We present a novel method for determining a spectral phase derivative from a single spectral interferogram obtained by using a white-light interferometry technique, which is further used for calculation of chromatic dispersion profile. The method is based on direct calculations of a second derivative of the registered spectral intensity at extremal points. We explain theoretical background of the method, discuss its limitations and evaluate an accuracy by numerical simulations. Additionally, we validate the proposed method in dispersion measurements of the BK7 glass plate and the SMF-28 fiber.