On-chip Microscopy Using Random Phase Mask Scheme

In this study, a simple and novel phase-retrieval scheme is implemented using multi-angle illumination to enhance the resolution of lensless microscopy. A random-phase mask (from 0 to 2π) precedes the sample to encode the information at the sensor plane. The sample is illuminated with multiple angles that are symmetrical along the optical axis of the system. The system is initially calibrated while recording the images without any sample at the corresponding multi angles. The two types of image are mutually subtracted, and the resultant images are summed at the sensor plane and backpropagated to the sample plane. The final image is free of the twin-image effect, and has a high signal-to-noise ratio owing to the multi angles of the illumination scheme. This scheme gives a resolution of ~4 micron for a large field-of-view (~15 mm2). The scheme is useful for robust imaging owing to the fast phase-retrieval method, and it enables a straightforward analytical reconstruction instead of using complicated iterative algorithms in a lensless microscopic setup.