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Surface topographical and compositional characterization using backscattered electron methods
Surface topographical and compositional characterization using backscattered electron methods
1991
D. A. Wassink
J. Z. Raski
J. A. Levitt
D. Hildreth
K. C. Ludema
Keywords:
Backscatter
Surface finish
Electron
Analytical chemistry
Materials science
backscattered electron
Mineralogy
Optics
Correction
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