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poly-Si電極における仕事関数変調とそのデバイスインパクト ~ SiON/poly-Si界面の微量Hfの効果 ~
poly-Si電極における仕事関数変調とそのデバイスインパクト ~ SiON/poly-Si界面の微量Hfの効果 ~
2005
zirou yu ue
yasuhiro simamoto
masao inoue
sei osamu mizutani
katuya siga
fumiko fuzita
jun'iti tutimoto
yosikazu oono
masahiro yoneda
Keywords:
Work function
Electronic engineering
Composite material
Materials science
fermi level pinning
Electrical engineering
Engineering physics
Correction
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