Systematic errors and their corrections of the IEC standard method for absolute quantum efficiency measurement on photoluminescent materials

Photoluminescence (PL) quantum efficiency (QE) is one of the important parameters to characterize photoluminescent materials especially for lighting and display application. Under a few assumptions, IEC standard (IEC62607-3-1) provides two methods of high simplicity and moderate accuracy with an integrating sphere for absolute measurement of QE named 'collimated incident light method (CILM)' and 'diffuse incident light method (DILM)', respectively [1,2]. However, the simplification unavoidably causes systematic errors, which could be significant in certain cases of sphere reflectance or material properties. In this paper, we numerically investigate the systematic errors that can occur in the standardised methods employing Monte Carlo ray-tracing simulation and also present their correction method based on additional measurement to estimate diffusivity of sample reflectance at excitation wavelength and absorption of sample at PL emission wavelength.