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Real-Time Image Registration via A Deep Leaning Approach for Correlative X-ray and Electron Microscopy
Real-Time Image Registration via A Deep Leaning Approach for Correlative X-ray and Electron Microscopy
2021
Yanqi Luo
Nestor J. Zaluzec
Mathew J. Cherukara
Xiaolan Wu
Si Chen
Keywords:
X-ray
Computer science
Electron microscope
Correlative
Image registration
Optics
Correction
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