Scanning Probe Microscopes for the Electrical Characterization of Semiconductors
2003
Keywords:
- Near-field scanning optical microscope
- Scanning probe microscopy
- Electrochemical scanning tunneling microscope
- Microscope
- Scanning Hall probe microscope
- Analytical chemistry
- Microscopy
- Scanning capacitance microscopy
- Optics
- Kelvin probe force microscope
- Materials science
- Nanotechnology
- Non-contact atomic force microscopy
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI