P-130: Current Mapping and Noise Testing Techniques for Detection of Latent Pixel Shorts in PLED Displays

Formation of latent shorts in pixilated Polymer Light Emitting Devices (PLED) is one of the major contributors to their poor reliability and a formidable obstacle to PLED commercialization. We investigated two testing techniques aimed at predicting when a PLED display is susceptible to developing latent pixel shorts.