INTEGRATED INSTRUMENTATION SYSTEM FOR CHARACTERIZATION AND PARAMETER EXTRACTION OF ELECTRONIC COMPONENTS

Implementation of an integrated instrumentation system for characterizing and extracting parameters of discrete and integrated electronic components is presented. The experimental data for the devices tested is obtained using high sensitivity HP measuring equipment. The technique used consists of acquiring large sets of data from static I-V characteristics, C-V profiles and impedance measurements performed automatically by a computer. Software routines have been implemented under Matlab environment to extract Spice model parameters for a large set of passive devices. A good agreement between measured and calculated device parameters has been obtained.