The new JEOL JEM-ARM200CF at the University of Illinois at Chicago

A multitude of characterization techniques that can be applied across a wide range of length scales and to a variety of materials are available on modern scanning transmission electron microscopes (STEM). In 2011, such an instrument was installed at the University of Illinois at Chicago: the aberration-corrected cold-field emission JEOL JEM-ARM200CF, capable of atomic-resolution imaging and spectroscopy in a temperature range between 80–1300 K. This paper will review a number of studies focusing on both structural and chemical characterization of materials including NbH, SrTiO3, Pt catalysts and AlxGa1–xN nanowires. Microscope versatility, a central theme of this work, is realized through the ability to perform fine-scale chemical characterization while retaining high spatial resolution. Of particular interest to many studies is the visualization of light elements, such as N, O or H, using simultaneous high-angle annular dark-field (HAADF) and annular bright-field (ABF) imaging.