GOES-R Series Solar X-ray and Ultraviolet Irradiance

Abstract The GOES-R Series Extreme Ultraviolet and X-ray Irradiance Sensors (EXIS) measures solar irradiance at the very short wavelengths where the Sun’s output varies the most. EXIS has two primary components, the X-ray Sensor (XRS) and the Extreme Ultraviolet Sensor (EUVS). The first level of processed data has cadences of 1–30 s. XRS data products include X-ray fluxes in two wavelength bands, flare event detection, and flare locations. EUVS products include irradiances for seven solar lines representative of coronal, transition region, and chromospheric variability, the Magnesium II index, a modeled solar spectrum from 5 to 127 nm, and event detection.