Accurately accounting for effects on times-of-flight caused by finite field-transition times during the ejection of ions from a storage trap: A study for TOF and MRTOF mass spectrometry.

In applied forms of time-of-flight mass spectrometry utilizing ion storage devices prior to an analysis device, a non instantaneous electric ejection pulse appearing in the region of ion storage is applied for acceleration into the time-of-flight analyzer. Dependent on the duration of the field transition time up to full field strength, the calculated mass value of the ion from the time-of-flight will be modified. For novel applications dedicated to precision measurements, as multi-reflection time-of-flight mass spectrometry of short-lived isotopes, it is aimed for to continuously decrease the measurement uncertainty while providing a mass accuracy in the same order. Even though dynamic-field models for time-of-flight mass spectrometry have been considered in the past for technological advances, it is important to study the accuracy of the measured mass in this context. Using a simplified linear model for the field transition, we provide a basic investigation of the scenario, and discuss the deviation from the classical "mass-over-charge" dependency of the ions' flight, which becomes violated. Further, we provide numbers for the deviations of mass results for typical time-of-flight systems and also multi-reflection time-of-flight devices.