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NBTI-Stress Induced Grain-Boundary Degradation in Low-Temperature Poly-Si Thin-Film Transistors
NBTI-Stress Induced Grain-Boundary Degradation in Low-Temperature Poly-Si Thin-Film Transistors
2007
Chih-Yang Chen
Ming Wen Ma
Wei-Cheng Chen
Hsiao-Yi Lin
Kuan-Lin Yeh
Shen-De Wang
Tan Fu Lei
Keywords:
Nanotechnology
Thin-film transistor
Grain boundary
Composite material
Materials science
Degradation (geology)
stress induced
Correction
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