Ferromagnetism and Surface Chemical States of Ni0.5Zn0.5Fe2O4 Thin Film Grown on LaNiO3 Bottom Layer Prepared by Chemical Solution Deposition

Ni0.5Zn0.5Fe2O4 (NZFO) thin films grown on LaNiO3 (LNO) buffered Si (100) substrates were prepared by chemical solution deposition. The sample annealed rapidly at 600°C in oxygen atmosphere. X-ray diffraction result showed that, the sample annealed in oxygen atmosphere is polycrystalline thin film. Field-emission scanning electron microscopy result revealed that the average grain size of the sample is about 20 nm. The magnetic measurement gave a typical value of the saturation magnetization of 0.767 emu/cm3. The chemical states and chemical composition of the film was also determined by X-ray photoelectron spectroscopy (XPS).