Generalized Parameter Extraction Method for Symbolic Analysis of Analog Circuits Containing Pathological Elements

This chapter gives a description of the extension of Generalized Parameter Extraction Method (GPEM) for symbolic analysis of large-scale analog circuits containing pathological elements. The brief overview of the parameter extraction approach is included. An algorithm implementing the concept of Higher Order Summative Cofactors (HOSC) for determinants computation of the pathological element-based circuits is proposed. In this chapter, we also present the hierarchical decomposition techniques of upward and downward analysis of electronic circuits by GPEM. The proposed techniques are used in freeware symbolic analyzer CirSym. Several examples are presented to illustrate the advantages of the GPEM applications.