Characterization of Porous Silicon Using Terahertz Differential Time-Domain Spectroscopy

Suchitra Ramani,Alan Cheville,J. Escorcia Garcia,Vivechana Agarwal

Characterization of Porous Silicon Using Terahertz Differential Time-Domain Spectroscopy

2007

Suchitra Ramani
Alan Cheville
J. Escorcia Garcia
Vivechana Agarwal

Porous silicon (PS) films of different porosities are investigated using Terahertz Differential Time-Domain spectroscopy (THz-DTDS). Preliminary measurements indicate a power law type of behavior in the PS conductivity response.

Keywords:

Thin film
Spectroscopy
Porous silicon
Time domain
Terahertz radiation
Conductivity
Materials science
Silicon
Analytical chemistry
Refractive index

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