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Nanoanalysis in SEM and STEM: EDS Using Silicon Drift Detectors in Comparison to EELS Using Cs-Corrected STEM
Nanoanalysis in SEM and STEM: EDS Using Silicon Drift Detectors in Comparison to EELS Using Cs-Corrected STEM
2010
M. Falke
Ralf Terborg
Andi Käppel
M Rohde
M. Gass
Andrew Bleloch
Sascha Hermann
Ramona Ecke
Thomas Waechtler
Stefan Schulz
Keywords:
Detector
Analytical chemistry
Silicon drift detector
Materials science
Silicon
Metallurgy
Correction
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