Method for Assembling Nanosamples and a Cantilever for Dynamic Cantilever Magnetometry

Dynamic cantilever magnetometry (DCM) offers unique capabilities and sensitivity to probe magnetization processes in individual microscopic samples. Assembling the samples and a cantilever and the sensitivity of DCM are important for applications in nanomagnetism research; so far, DCM has been used primarily on wire-shaped samples, because no universal method for sample assembly has been available. To fill that gap, this study presents a method, using dual focused ion beams, a scanning electron microscope, and a nanomanipulator, that allows the extension of DCM to study the magnetic properties of individual nanostructures of arbitrary shape.