A Novel Methodology for Assessing and Modeling Manufacturing Processes

2021 
Historically, researchers and practitioners have often failed to consider all the areas, factors, and implications of a process within an integrated manufacturing model. Thus, the aim of this research was to propose a holistic approach to manufacturing processes in order to assess their status and performance to improve target indicators such as product quality. For this purpose, a conceptual model is designed by identifying areas, flows, and indicators that are relevant to the assessment of a manufacturing system. Moreover, using the conceptual model, manufacturing systems can be modeled considering all related flows and decision-making options in the respective areas of production, maintenance, and quality. As a result, this model serves as the basis for the integral management and control of manufacturing systems in digital twin models for the regulation of process stability and quality with maintenance strategies. Thus, an assessment based on the conceptual model improves the knowledge level of all elements involved in the manufacturing of a product according to the desired quality specifications. The continuous monitoring of all areas and flows together with the optimal strategies in the quality and maintenance areas can enable companies to increase their profitability and customer service level. In this context, the discussion section lists key decision aspects for the assessment and improvement of manufacturing systems, while also providing a methodological sequence to evaluate and improve manufacturing systems. In conclusion, the conceptual approach allows better decision making, ensuring continuous optimization along the manufacturing asset lifecycle and providing a unique selling proposition for equipment producers and service engineering suppliers, as well as for production and assembly companies.
    • Correction
    • Source
    • Cite
    • Save
    • Machine Reading By IdeaReader
    19
    References
    0
    Citations
    NaN
    KQI
    []