Determination of tellurium in selenium by wavelength dispersive X-ray fluorescence spectrometry

An X-ray fluorescence spectrometric procedure has been developed for the determination of tellurium in selenium. The method involves dissolution of the sample in HCl–HNO3 and measurement of the Te Lα1 line intensity using a scandium X-ray tube and a flow-proportional counter. In the above determination, the Rayleigh-scattered Sc Kα target line is used as an internal-ratio line. The procedure permits the determination of tellurium in the range 0.5–5% with 2.5% relative standard deviation.