Scanning microscopies of superconductors at very low temperatures

Abstract We discuss basics of Scanning Tunneling Microscopy and Spectroscopy (STM/S) of the superconducting state with normal and superconducting tips. We present a new method to measure the local variations in the Andreev reflection amplitude between a superconducting tip and the sample. This method is termed Scanning Andreev Reflection Spectroscopy (SAS). We also briefly discuss vortex imaging with STM/S under an applied current through the sample, and show the vortex lattice as a function of the angle between the magnetic field and sample’s surface.