Methods for the calibration of current cells for digital-to-analog converter circuits and digital-to-analog converter circuit

A method for calibration of current cells (10p, 10n) for a digital-to-analog converter circuit, wherein during an operating phase of a cell current flowing through the sum of a current in a mirror transistor (11) is formed with a further current in a calibration transistor (15) which is connected in parallel to the mirror transistor (11), to an output node (1) of the current cell can be tapped, wherein align which the cell current during a calibration phase, a reference current in the current cell (10p, 10n) is impressed, and wherein the calibration transistor (15) is connected as a diode during the calibration phase is substantially, so that the current through the calibration transistor (15) the difference between the reference current and the current in the mirror transistor (11), the method comprising: - providing an additional current cell (10p, 10n), - interconnecting the current cells (10p, 10n) in response to a digital input signal of the digital-analog converter circuit with a signal output of the digital-analog converter circuit, while one of the current cells (10p, 10n) for calibration with a reference-current source ...