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Enhance the lifetime and bias stress reliability in organic vertical transistor by UV/Ozone treatment
Enhance the lifetime and bias stress reliability in organic vertical transistor by UV/Ozone treatment
2016
Hung-Cheng Lin
Ming Yu Chang
Hsiao-Wen Zan
Hsin-Fei Meng
Yu-Chiang Chao
Keywords:
bias stress
Optoelectronics
Ozone
Transistor
Materials science
uv ozone
Correction
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