Formation of fractal microstructures in conductive layers of indium-tin oxides and zinc oxide

In this paper, we have studied the fractal microstructures that form within conducting layers of oxide compositions and the effects that happen during electrical breakdown. We have determined that application of additional polymer films on top of the layers of oxide compositions allows one to visualize the breakdown processes taking place in the structure. The enlarged "polymer photography" that results in this makes it possible to assess the quality of contact layers without using high-resolution optical equipment.