Cavity Lifetime Phase-Shift Method for Sensitive Reflectance Measurements at Mid-infrared Wavelengths

Munson A. Kwok,J.M. Herbelin,R. H. Ueunten

Cavity Lifetime Phase-Shift Method for Sensitive Reflectance Measurements at Mid-infrared Wavelengths

1981

Munson A. Kwok
J.M. Herbelin
R. H. Ueunten

Abstract : The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9-micron wavelength is described.

Keywords:

Reflectivity
Phase (waves)
Optics
Infrared spectroscopy
Infrared
Analytical chemistry
Wavelength
Chemistry
Image resolution
Optoelectronics
mid infrared

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