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Observation of nano crystals in a-Si/Ge film by annealing in situ X ray diffraction
Observation of nano crystals in a-Si/Ge film by annealing in situ X ray diffraction
2017
Masahiro Adachi
Ryo Toyoshima
Kazuya Tokuda
Yoshihiro Saito
Syunsuke Fujii
Makoto Kiyama
Yoshiyuki Yamamoto
Yusuke Nishino
Muthusamy Omprakash
Tsunehiro Takeuchi
Keywords:
Thermoelectric materials
Crystallography
Annealing (metallurgy)
Crystal
Nano-
X-ray crystallography
Materials science
nano crystals
In situ
Correction
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