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Study of Al/Si interface by photoemission, Auger electron spectroscopies
Study of Al/Si interface by photoemission, Auger electron spectroscopies
1980
Kinya Kobayashi
James R. Barth
F. Gerken
Clayton Kunz
Keywords:
Angle-resolved photoemission spectroscopy
Electron spectroscopy
Valence band
Auger electron spectroscopy
Inverse photoemission spectroscopy
Chemistry
Molecular physics
Atomic physics
Correction
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