Rectification effect in La1.89Ce0.11CuO4/SrTiO3/La0.67Sr0.33MnO3 heterostructure

Perovskite oxide junctions of p-type colossal magneto-resistance material La0.67Sr0.33MnO3 (LSMO), strontium titanate insulator SrTiO3 (STO) and n-type high-Tc superconductor La1.89Ce0.11CuO4 (LCCO) were deposited on STO (001) substrates by the pulsed laser deposition method. The current?voltage (I?V) characteristics were measured at room temperature and pronounced rectifying characteristics were observed. The trilayer junctions with different thicknesses of the middle STO insulator were investigated and the measurement exhibits a remarkable insulator thickness dependence in their I?V characteristics. We attribute the rectification of the trilayer junctions to the interfaces between different materials by energy band analysis.