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Multiple Stress Memorization In Advanced SOI CMOS Technologies
Multiple Stress Memorization In Advanced SOI CMOS Technologies
2007
Andrew Bok Chuan Wei
Maciej Wiatr
Anthony Buda Mowry
Andreas Gehring
Roman Boschke
Carlton K. Scott
Jan Hoentschel
S. Duenkel
Martin Gerhardt
Th. Feudel
Markus Lenski
Frank Wirbeleit
Rainer Otterbach
Richard Callahan
George R. Koerner
N Krumm
D. Greenlaw
Martin Raab
Manfred Horstmann
Keywords:
Silicon on insulator
Electronic engineering
CMOS
Computer science
Memorization
Correction
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