Noninvasive high-voltage measurement in mammography by crystal diffraction spectrometry.

Wavelength dispersive crystal diffraction spectrometry has been applied to the measurement of the accelerating voltage on an x‐ray source in a prototype experiment in the mammographic source. The results indicate that this noninvasive approach can yield determinations of such voltages within 0.1 kV, a level of imprecision that appears adequate for high‐level standardization of such potentials.