Large area silicon sheet by EFG. Annual progress report, October 29, 1975--September 30, 1976
1976
At the end of one year the program is on schedule. EFG ribbon growth system JPL No. 2 is being used to perform meaningful growth rate and ribbon thickness experiments. The new, wide ribbon growth system is in operation. A theoretical study of stresses in ribbons is reported. EFG ribbons have been observed to exhibit a characteristic defect structure which is orientation dependent in the early stages of growth.
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